CN 41-1243/TG ISSN 1006-852X
Volume 42 Issue 6
Jan.  2023
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Article Contents
DOI K. Toshiro, AIDA Hideo, OHNISHI Osamu, YIN Shaohui, REN Yinghui. Challenges of future high-precision polishing methods for hard-to-process materials by the fusion of environmental control and plasma technology[J]. Diamond & Abrasives Engineering, 2022, 42(6): 637-649. doi: 10.13394/j.cnki.jgszz.2022.7001
Citation: DOI K. Toshiro, AIDA Hideo, OHNISHI Osamu, YIN Shaohui, REN Yinghui. Challenges of future high-precision polishing methods for hard-to-process materials by the fusion of environmental control and plasma technology[J]. Diamond & Abrasives Engineering, 2022, 42(6): 637-649. doi: 10.13394/j.cnki.jgszz.2022.7001

Challenges of future high-precision polishing methods for hard-to-process materials by the fusion of environmental control and plasma technology

doi: 10.13394/j.cnki.jgszz.2022.7001
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  • Received Date: 2022-09-06
  • Accepted Date: 2022-11-19
  • Rev Recd Date: 2022-11-16
  • Available Online: 2023-01-14
  • Wide-band-gap semiconductors such as silicon carbide, gallium nitride, and diamond are known as hard-to-process materials. In this study, two types of chemical mechanical polishing (CMP)-related processing equipment were designed to create novel high-efficiency and high-quality processing technology for these crystal substrates. Applying these apparatuses, the processing mechanisms are discussed and the processing characteristics of the hard-to-process substrates investigated. The two types of prototype processing equipment were the closed chamber-type processing environment control CMP equipment and the plasma fusion CMP equipment. In the former, high-efficiency processing was attempted by introducing a photocatalytic reaction while adding ultraviolet (UV) irradiation to a high-pressure oxygen atmosphere. In the latter, we expected a synergistic effect that could bring out the features of atmospheric pressure plasma chemical vaporization machining (P-CVM) and CMP, especially with a diamond substrate that is very hard and chemically stable. When the processing mechanisms of these equipment were examined, the processing was promoted while forming reaction products such as hydrated and oxide films on the extreme surface. Therefore, the chamber-type CMP equipment by UV irradiation was particularly effective in a high-pressure oxygen environment. In the plasma fusion CMP equipment, high-efficiency processing of the diamond substrate was possible when P-CVM and CMP were simultaneously operated in an oxygen atmosphere. Furthermore, based on the studied processing mechanism, a "cyclic processing method" consisting of two steps, a pseudo radical field / reaction product formation step and a new surface contact magnetorheological finishing step, was proposed as a highly efficient processing process.

     

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  • [1]
    DOI T, MARINESCU I D, KUROKAWA S. Advances in CMP polishing technologies [M]. Amsterdam: Elsevier, 2012, 15-19.
    [2]
    MARINESCU I D,DOI T, UHLMANN E. Handbook of ceramics grinding and polishing (2nd edition) [M]. Amsterdam: Elsevier, 2015, 275-315.
    [3]
    MARINESCU I D, UHLMANN EDOI T. Handbook of ceramics lapping and polishing [M]. New York: CRC Press (Taylor & Francis Group), 2006, 341-477.
    [4]
    DOI T. Details of semiconductor CMP technology [M]. Tokyo: Kogyo Chosakai Publishing Co., 2001, 13-38.
    [5]
    [6]
    TAGAMI M. Metallization challenges in 3D flash memory [C]// The Planarization and CMP Technical Committee, The Japan Society for Precision Engineering. 2022 Proceedings of Meeting of Planarization CMP Committee. Tokyo: [s.n.], 2023: 109.
    [7]
    CHEN R, LI Y C, CAI J M, et al. Atomic level deposition to extend Moore's law and beyond [J]. International Journal of Extreme Manufacturing,2020(2):022002.
    [8]
    NAKAMURA S, MUKAI T, SENOH M, et al. Thermal annealing effects on P-type Mg-doped GaN films [J]. Japanese Journal of Applied Physics,1992,31(2B):L139. doi: 10.1143/JJAP.31.L139
    [9]
    DOI T. Current status and future prospects of GaN substrates for green devices [J]. Sensors and Materials,2013,25(3):141-154. doi: 10.18494/SAM.2013.854
    [10]
    DOI T. Next-generation, super-hard-to-process substrates and their high-efficiency machining process technologies used to criate innovative devices [J]. International Journal of Automation Technology,2018,12(2):145-153. doi: 10.20965/ijat.2018.p0145
    [11]
    DOI T K, KAGEYAMA T, KASAI T, et al. A new processing technique of GaAs single crystals and its mechanism [J]. International Journal of the Japan Society for Precision Engineering,1996,30(1):16-22.
    [12]
    DOI T, MARINESCU I D, KUROKAWA S. Advances in CMP polishing technologies [M]. Amsterdam: Elsevier, 2011.
    [13]
    AIDA H, KIM S W, IKEJIRI K, et al. Precise mechanical polishing of brittle materials with free diamond abrasives dispersed in micro-nano-bubble water [J]. Precision Engineering,2014,40:81-86. doi: 10.1016/j.precisioneng.2014.10.008
    [14]
    NAKAJIMA K. Tribomicro plasma [J]. Journal of the Japan Society for Abrasive Technology,2007,51(8):453-456.
    [15]
    SANO Y, WATANABE M, YAMAMURA K, et al. Polishing characteristics of silicon carbide by plasma chemical vaporization machining [J]. Japanese Journal of Applied Physics, 2006, 45(10s): 8277-8280. Doi 10.1143/JJAP.45.8277
    [16]
    DOY/DOI T K, ICHIKAW K, PHILIPOSSIAN A., A new atmosphere control bell-jar type CMP machine and its characteristics with optoelectronics materials [J]. Proceedings of AUSTCERAM, 2002: 249.
    [17]
    DOI T, SANO Y, KUROKAWA S, et al. Study on high efficiency precision machining method of advanced hard working substrate (report 1) [J]. Proceedings of JSPE, Spring Meeting,2013:639-640. doi: 10.11522/pscjspe.2013S.0.639.0
    [18]
    DOI T. Impact of novel bell-jar type CMP machine on CMP characteristics of optoelectronics materials [J]. Proceedings of ICM/NFT’06, 2006: 1.
    [19]
    SANO Y, DOI T, KUROKAWA S, et al. Study on high efficiency precision machining method of advanced hard working substrate (report 2) [J]. Proceedings of JSPE, Spring Meeting,2013:641-642. doi: 10.11522/pscjspe.2013S.0.641.0
    [20]
    DOY/DOI T. Colloidal silica polishing based on micromechanical removal action and its applications [J]. Sensors and Materials,1988,1(3):153-168.
    [21]
    KOYAMA K, AIDA H, UNEDA M, et al. Effects of N-face finishing on geometry of double-side polished GaN substrate [J]. International Journal of Automation Technology,2014,8(1):121-127. doi: 10.20965/ijat.2014.p0121
    [22]
    AIDA H, TAKEDA H, DOI T, et al. Chemical mechanical polishing of gallium nitride with colloidal silica [J]. Journal of The Electrochemical Society,2011,158:H1206-H1212. doi: 10.1149/2.024112jes
    [23]
    AIDA H, DOI T, YAMAZAKI T, et al. Progress and challenges for chemical mechanical polishing of gallium nitride [J]. Materials Research Society Symposium Proceedings, 2013,1560:875-884. doi: 10.1557/opl.2013.875
    [24]
    YAMAMURA K, TAKIGUCHI T, UEDA M, et al. Plasma assisted polishing of single crystal SiC for obtaining atomically flat strain-free surface [J]. CIRP Annals - Manufacturing Technology,2011,60:571-574. doi: 10.1016/j.cirp.2011.03.072
    [25]
    AIDA H, DOI T, TAKEDA H, et al. Ultraprecision CMP for sapphire, GaN, and SiC for advanced optoelectronics materials [J]. Current Applied Physics,2012,12(Suppl.2):S41-S46. doi: 10.1016/j.cap.2012.02.016
    [26]
    De NARDIS D, DOI T, HISKEY B, et al. Modeling copper CMP removal rate dependency on wafer pressure, velocity, and dissolved oxygen concentration [J]. Journal of The Electrochemical Society,2006,153(5):G428-G436. doi: 10.1149/1.2180627
    [27]
    MARINESCU I D,DOI T, UHLMANN E. Handbook of ceramics grinding and polishing (2nd edition) [M]. Amsterdam: Elsevier, 2015, 449.
    [28]
    DOI T. An innovative processing concept of SiC, GaN and diamond substrates for the next generation semiconductors, and its future perspectives [C]// Production Engineering Institution, The Chinese Mechanical Engineering Society. Proceedings of the 14th China-Japan International Conference on Ultra-Precision Machining Process (CJUMP2018). Harbin: [s.n.], 2018: 23
    [29]
    SANO Y, SHIOZAWA K, DOI T, et al. High-efficiency planarization method combining mechanical polishing and atmospheric-pressure plasma etching for hard-to-machine semiconductor substrates [J]. Semconductor Substrates, The Japan Society of Mechanical Engineering (JSME),2016,3(1):1-9.
    [30]
    OYAM K, DOI K T. Study on a novel CMP/P-CVM fusion processing system (type-b) and its basic characteristics [C]// The Planarization and CMP Technical Committee, The Japan Society for Precision Engineering. Proceeding of International Conference on Planarization Technology (ICPT2014). Kobe: [s.n.], 2014.
    [31]
    NISHIZAWA H, DOI T. Study on a novel CMP/P-CVM fusion processing system (type B) and its basic characteristics [C]// The Planarization and CMP Technical Committee, The Japan Society for Precision Engineering. 2014 Proceedings of Meeting of Planarization CMP Committee. Kobe: [s.n.], 2014.
    [32]
    TAKEDA H, DOI T, KIM S W, et al. High efficiency processing and its processing mechanism of large area diamond substrate due to plasma fusion CMP [J]. IEICE Technical Report,2017,117(334):1-6.
    [33]
    DOI T. Design and novel processing method “plasma fusion CMP® machine” - Processing characteristics of SiC, GaN & diamond substrates [C]// Southern University of Science and Technology. Proceedings of the Symposium on Ultra-High-Speed Machining and Machining of Hard & Brittle Materials. Shenzhen: [s.n.], 2019.
    [34]
    MAUER G, VAßEN R, STÖVER D. Plasma and particle temperature measurements in thermal spray: Approaches and applications [J]. Journal of Thermal Spray Technology,2010,20:391-406. doi: 10.1007/s11666-010-9603-z
    [35]
    SANO Y, WATANABE M, KATO T, et al. Temperature dependence of plasma chemical vaporization machining of silicon and silicon carbide [J]. Materials Science Forum,2009,600-603:847-850. doi: 10.4028/www.scientific.net/MSF.600-603.847
    [36]
    NISHIZAWA H, DOI T, OYAMA K, et al. Design and test of innovative plasma fusion CMP equipment [J]. Proceedings of JSPE, Spring Meeting,2016:381-382. doi: 10.11522/pscjspe.2016S.0_381
    [37]
    SANO Y, DOI T, KUROKAWA S, et al. Dependence of GaN removal rate of plasma chemical vaporization machining on mechanically introduced damage [J]. Sensors and Materials,2014,26(6):429-434.
    [38]
    AIDA H, DOI T. Polishing of difficult-to-process single crystals by next-generation processing and its prospects [J]. Shinku / Vacuum Journal,2018,7(11):11-14.
    [39]
    REN Y, LI K, LI W, et al. Research on a UV-assisted chemical modification strategy for monocrystalline silicon [J]. Mechanical Science,2021,12(1):133-141. doi: 10.5194/ms-12-133-2021
    [40]
    DOI T K, SANO Y, KUROWAKA S, et al. Novel chemical mechanical polishing/plasma-chemical vaporization machining (CMP/P-CVM) combined processing of hard-to-process crystals based on innovative concepts [J]. Sensors and Materials,2014,26(6):403-415. doi: 10.18494/SAM.2014.978
    [41]
    LUO H, GUO M, YIN S, et al. An atomic-scale and high efficiency finishing method of zirconia ceramics by using magnetorheological finishing [J]. Applied Surface Science,2018,444:569-577. doi: 10.1016/j.apsusc.2018.03.091
    [42]
    REN Y, LI K, LI W, et al. A hybrid chemical modification strategy for monocrystalline silicon microgrinding: Experimental investigation and synergistic mechanism [J]. Chinese Journal of Aeronautics,2022. doi: 10.1016/j.cja.2022.11.004
    [43]
    YIN Shaohui, GONG Sheng, HE Bowen, et al. Development on synergistic process and machine tools integrated inclined axis grinding and magnetorheological polishing for small aspheric surface [J]. Journal of Mechanical Engineering,2018,54(21):205-211. doi: 10.3901/JME.2018.21.205
    [44]
    ZHANG B, YIN J F. The 'skin effect' of subsurface damage distribution in materials subjected to high-speed machining [J]. International Journal of Extreme Manufacturing,2019,1:012007. doi: 10.1088/2631-7990/ab103b
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