Diamond films are deposited on Si substrate with H
2/CH
4/CO
2 as source using microwave plasma chemical vapor deposition method.The effect of microwave power and CO
2 on the growth of diamond films is analyzed.The quality,surface morphology and grain orientation of diamond film are systematically characterized by Raman spectroscopy,scanning electron microscopy(SEM)and X-ray diffraction(XRD).The results show that an appropriate increase of microwave power could promote the diamond grain growth and increase the(100)orientation.It's also shown that adding an appropriate amount of CO
2 could improve the quality and growth rate of diamond films,and maintain surface morphology.However,with the increase of CO
2 content,the diamond surface morphology changes greatly and the quality and growth rate of diamond films increases firstly and then decreases.